Vulnerability Details : CVE-2023-28587

Memory corruption in BT controller while parsing debug commands with specific sub-opcodes at HCI interface level.
Published 2023-12-05 03:15:10
Updated 2024-04-12 16:15:12
Source Qualcomm, Inc.
View at NVD,   CVE.org
Vulnerability category: OverflowMemory Corruption

Products affected by CVE-2023-28587

Exploit prediction scoring system (EPSS) score for CVE-2023-28587

EPSS FAQ
0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 9 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2023-28587

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.8
 HIGH CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
 NIST
7.8
 HIGH CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
 Qualcomm, Inc.

CWE ids for CVE-2023-28587

  • The product performs operations on a memory buffer, but it reads from or writes to a memory location outside the buffer's intended boundary. This may result in read or write operations on unexpected memory locations that could be linked to other variables, data structures, or internal program data.
    Assigned by: product-security@qualcomm.com (Secondary)
  • The product writes data past the end, or before the beginning, of the intended buffer.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2023-28587

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