Memory corruption while loading an ELF segment in TEE Kernel.
Published 2023-12-05 03:15:10
Updated 2024-04-12 16:15:11
View at NVD,   CVE.org
Vulnerability category: OverflowMemory Corruption

Products affected by CVE-2023-28585

Max 200 conditions are displayed on this page, to prevent potential performance issues, please refer to NVD for more details.

Exploit prediction scoring system (EPSS) score for CVE-2023-28585

0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 7 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2023-28585

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
8.8
HIGH CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:C/C:H/I:H/A:H
2.0
6.0
NIST
8.2
HIGH CVSS:3.1/AV:L/AC:L/PR:H/UI:N/S:C/C:H/I:H/A:H
1.5
6.0
Qualcomm, Inc.

CWE ids for CVE-2023-28585

  • The product performs operations on a memory buffer, but it reads from or writes to a memory location outside the buffer's intended boundary. This may result in read or write operations on unexpected memory locations that could be linked to other variables, data structures, or internal program data.
    Assigned by: nvd@nist.gov (Primary)
  • The product performs a calculation to determine how much memory to allocate, but an integer overflow can occur that causes less memory to be allocated than expected, leading to a buffer overflow.
    Assigned by: product-security@qualcomm.com (Secondary)

References for CVE-2023-28585

Jump to
This web site uses cookies for managing your session, storing preferences, website analytics and additional purposes described in our privacy policy.
By using this web site you are agreeing to CVEdetails.com terms of use!