Vulnerability Details : CVE-2023-21517
Heap out-of-bound write vulnerability in Exynos baseband prior to SMR Jun-2023 Release 1 allows remote attacker to execute arbitrary code.
Vulnerability category: OverflowMemory CorruptionExecute code
Products affected by CVE-2023-21517
- cpe:2.3:h:samsung:exynos:-:*:*:*:*:*:*:*
Exploit prediction scoring system (EPSS) score for CVE-2023-21517
0.33%
Probability of exploitation activity in the next 30 days
EPSS Score History
~ 71 %
Percentile, the proportion of vulnerabilities that are scored at or less
CVSS scores for CVE-2023-21517
Base Score | Base Severity | CVSS Vector | Exploitability Score | Impact Score | Score Source | First Seen |
---|---|---|---|---|---|---|
8.8
|
HIGH | CVSS:3.1/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H |
2.8
|
5.9
|
Samsung Mobile | |
9.8
|
CRITICAL | CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H |
3.9
|
5.9
|
NIST |
CWE ids for CVE-2023-21517
-
The product copies an input buffer to an output buffer without verifying that the size of the input buffer is less than the size of the output buffer, leading to a buffer overflow.Assigned by: mobile.security@samsung.com (Secondary)
-
The product writes data past the end, or before the beginning, of the intended buffer.Assigned by: nvd@nist.gov (Primary)
References for CVE-2023-21517
-
https://security.samsungmobile.com/securityUpdate.smsb?year=2023&month=06
Security Updates Firmware Updates | Samsung Mobile SecurityVendor Advisory
Jump to