Use after free vulnerability in decon driver prior to SMR Mar-2023 Release 1 allows attackers to cause memory access fault.
Published 2023-03-16 21:15:12
Updated 2023-03-23 20:17:19
View at NVD,   CVE.org
Vulnerability category: Memory Corruption

Exploit prediction scoring system (EPSS) score for CVE-2023-21459

0.11%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 43 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2023-21459

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
5.0
MEDIUM CVSS:3.1/AV:L/AC:H/PR:H/UI:N/S:C/C:L/I:L/A:L
0.8
3.7
Samsung Mobile
9.8
CRITICAL CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
3.9
5.9
NIST

CWE ids for CVE-2023-21459

  • Referencing memory after it has been freed can cause a program to crash, use unexpected values, or execute code.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2023-21459

Products affected by CVE-2023-21459

This web site uses cookies for managing your session, storing preferences, website analytics and additional purposes described in our privacy policy.
By using this web site you are agreeing to CVEdetails.com terms of use!