The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a large number in the parameter attrCount.
Published 2022-08-04 20:15:20
Updated 2022-08-10 18:05:25
Source MITRE
View at NVD,   CVE.org
Vulnerability category: Denial of serviceInformation leak

Products affected by CVE-2022-35858

Exploit prediction scoring system (EPSS) score for CVE-2022-35858

0.03%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 6 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2022-35858

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.8
HIGH CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
NIST

CWE ids for CVE-2022-35858

References for CVE-2022-35858

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