The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a large number in the parameter attrCount.
Published 2022-08-04 20:15:20
Updated 2022-08-10 18:05:25
Source MITRE
View at NVD,
Vulnerability category: Denial of serviceInformation leak

Exploit prediction scoring system (EPSS) score for CVE-2022-35858

Probability of exploitation activity in the next 30 days EPSS Score History
~ 14 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2022-35858

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen

CWE ids for CVE-2022-35858

Products affected by CVE-2022-35858

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