Memory corruption in i2c buses due to improper input validation while reading address configuration from i2c driver in Snapdragon Mobile, Snapdragon Wearables
Published 2022-12-13 16:15:18
Updated 2023-04-19 17:10:55
View at NVD,   CVE.org
Vulnerability category: Memory CorruptionInput validation

Products affected by CVE-2022-25697

Exploit prediction scoring system (EPSS) score for CVE-2022-25697

0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 13 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2022-25697

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.8
HIGH CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
NIST
8.4
HIGH CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
2.5
5.9
Qualcomm, Inc.

CWE ids for CVE-2022-25697

  • The product receives input or data, but it does not validate or incorrectly validates that the input has the properties that are required to process the data safely and correctly.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2022-25697

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