Memory corruption due to double free issue in kernel in Snapdragon Auto, Snapdragon Compute, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile
Published 2022-10-19 11:15:10
Updated 2023-04-19 17:10:55
View at NVD,   CVE.org
Vulnerability category: Memory Corruption

Exploit prediction scoring system (EPSS) score for CVE-2022-25660

0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 12 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2022-25660

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.8
HIGH CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
NIST
7.8
HIGH CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
Qualcomm, Inc.

CWE ids for CVE-2022-25660

  • The product calls free() twice on the same memory address, potentially leading to modification of unexpected memory locations.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2022-25660

Products affected by CVE-2022-25660

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