Vulnerability Details : CVE-2021-40028
The eID module has an out-of-bounds memory write vulnerability,Successful exploitation of this vulnerability may affect data integrity.
Vulnerability category: Memory Corruption
Products affected by CVE-2021-40028
- cpe:2.3:o:huawei:harmonyos:*:*:*:*:*:*:*:*
Exploit prediction scoring system (EPSS) score for CVE-2021-40028
0.08%
Probability of exploitation activity in the next 30 days
EPSS Score History
~ 36 %
Percentile, the proportion of vulnerabilities that are scored at or less
CVSS scores for CVE-2021-40028
Base Score | Base Severity | CVSS Vector | Exploitability Score | Impact Score | Score Source | First Seen |
---|---|---|---|---|---|---|
5.0
|
MEDIUM | AV:N/AC:L/Au:N/C:N/I:P/A:N |
10.0
|
2.9
|
NIST | |
7.5
|
HIGH | CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:H/A:N |
3.9
|
3.6
|
NIST |
CWE ids for CVE-2021-40028
-
The product writes data past the end, or before the beginning, of the intended buffer.Assigned by: nvd@nist.gov (Primary)
References for CVE-2021-40028
-
https://device.harmonyos.com/en/docs/security/update/security-bulletins-202201-0000001238736331
DocumentVendor Advisory
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