Lack of MBN header size verification against input buffer can lead to memory corruption in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Wearables
Published 2022-06-14 10:15:15
Updated 2023-04-19 17:10:55
View at NVD,   CVE.org
Vulnerability category: OverflowMemory Corruption

Exploit prediction scoring system (EPSS) score for CVE-2021-30350

0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 10 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2021-30350

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.2
HIGH AV:L/AC:L/Au:N/C:C/I:C/A:C
3.9
10.0
NIST
7.8
HIGH CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
NIST
8.4
HIGH CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
2.5
5.9
Qualcomm, Inc.

CWE ids for CVE-2021-30350

References for CVE-2021-30350

Products affected by CVE-2021-30350

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