Improper handling of sensor HAL structure in absence of sensor can lead to use after free in Snapdragon Auto
Published 2021-10-20 07:15:09
Updated 2021-10-26 18:52:27
View at NVD,   CVE.org
Vulnerability category: Memory Corruption

Exploit prediction scoring system (EPSS) score for CVE-2021-30315

Probability of exploitation activity in the next 30 days: 0.04%

Percentile, the proportion of vulnerabilities that are scored at or less: ~ 10 % EPSS Score History EPSS FAQ

CVSS scores for CVE-2021-30315

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source
7.2
HIGH AV:L/AC:L/Au:N/C:C/I:C/A:C
3.9
10.0
NIST
7.8
HIGH CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
NIST
8.4
HIGH CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
2.5
5.9
Qualcomm, Inc.

CWE ids for CVE-2021-30315

  • Referencing memory after it has been freed can cause a program to crash, use unexpected values, or execute code.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2021-30315

Products affected by CVE-2021-30315

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