Improper handling of sensor HAL structure in absence of sensor can lead to use after free in Snapdragon Auto
Published 2021-10-20 07:15:09
Updated 2021-10-26 18:52:27
View at NVD,   CVE.org
Vulnerability category: Memory Corruption

Exploit prediction scoring system (EPSS) score for CVE-2021-30315

0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 10 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2021-30315

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.2
HIGH AV:L/AC:L/Au:N/C:C/I:C/A:C
3.9
10.0
NIST
7.8
HIGH CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
NIST
8.4
HIGH CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
2.5
5.9
Qualcomm, Inc.

CWE ids for CVE-2021-30315

  • The product reuses or references memory after it has been freed. At some point afterward, the memory may be allocated again and saved in another pointer, while the original pointer references a location somewhere within the new allocation. Any operations using the original pointer are no longer valid because the memory "belongs" to the code that operates on the new pointer.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2021-30315

Products affected by CVE-2021-30315

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