Vulnerability Details : CVE-2021-1959

Possible memory corruption due to lack of bound check of input index in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon IoT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables
Published 2021-10-20 07:15:08
Updated 2021-10-26 18:00:02
Source Qualcomm, Inc.
View at NVD,   CVE.org
Vulnerability category: Memory Corruption

Exploit prediction scoring system (EPSS) score for CVE-2021-1959

EPSS FAQ
0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 10 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2021-1959

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.2
 HIGH AV:L/AC:L/Au:N/C:C/I:C/A:C
3.9
10.0
 NIST
7.8
 HIGH CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
 Qualcomm, Inc.

CWE ids for CVE-2021-1959

  • The product writes data past the end, or before the beginning, of the intended buffer.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2021-1959

Products affected by CVE-2021-1959

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