Memory corruption in key parsing and import function due to double freeing the same heap allocation in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon IoT, Snapdragon Voice & Music, Snapdragon Wearables
Published 2021-07-13 06:15:08
Updated 2021-07-15 20:14:06
View at NVD,   CVE.org
Vulnerability category: Memory Corruption

Exploit prediction scoring system (EPSS) score for CVE-2021-1888

0.05%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 14 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2021-1888

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.2
HIGH AV:L/AC:L/Au:N/C:C/I:C/A:C
3.9
10.0
NIST
7.8
HIGH CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
NIST
8.4
HIGH CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
2.5
5.9
Qualcomm, Inc.

CWE ids for CVE-2021-1888

  • The product calls free() twice on the same memory address, potentially leading to modification of unexpected memory locations.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2021-1888

Products affected by CVE-2021-1888

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