Possibility of double free of the drawobj that is added to the drawqueue array of the context during IOCTL commands as there is no refcount taken for this object in Snapdragon Auto, Snapdragon Compute, Snapdragon Consumer Electronics Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables in APQ8009, APQ8053, APQ8096AU, APQ8098, MSM8909W, MSM8917, MSM8953, MSM8996AU, Nicobar, QCS405, QCS605, QM215, Rennell, SA415M, Saipan, SC8180X, SDA660, SDA845, SDM429, SDM429W, SDM439, SDM450, SDM630, SDM632, SDM636, SDM660, SDM670, SDM710, SDM845, SDX20, SDX24, SDX55, SM6150, SM7150, SM8150, SM8250, SXR2130
Published 2020-06-02 15:15:13
Updated 2020-06-03 13:49:55
View at NVD,   CVE.org
Vulnerability category: Memory Corruption

Exploit prediction scoring system (EPSS) score for CVE-2020-3610

0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 10 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2020-3610

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
4.6
MEDIUM AV:L/AC:L/Au:N/C:P/I:P/A:P
3.9
6.4
NIST
7.8
HIGH CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
NIST

CWE ids for CVE-2020-3610

  • The product calls free() twice on the same memory address, potentially leading to modification of unexpected memory locations.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2020-3610

Products affected by CVE-2020-3610

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