Possible memory corruption in RPM region due to improper XPU configuration in Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wired Infrastructure and Networking
Published 2021-04-07 08:15:14
Updated 2022-05-03 16:04:40
View at NVD,   CVE.org
Vulnerability category: Memory Corruption

Exploit prediction scoring system (EPSS) score for CVE-2020-11210

0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 10 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2020-11210

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.2
HIGH AV:L/AC:L/Au:N/C:C/I:C/A:C
3.9
10.0
NIST
8.8
HIGH CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:C/C:H/I:H/A:H
2.0
6.0
NIST
9.3
CRITICAL CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:C/C:H/I:H/A:H
2.5
6.0
Qualcomm, Inc.

CWE ids for CVE-2020-11210

  • The product writes data past the end, or before the beginning, of the intended buffer.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2020-11210

Products affected by CVE-2020-11210

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