Possible memory corruption in BSI module due to improper validation of parameter count in Snapdragon Auto, Snapdragon Connectivity, Snapdragon Mobile
Published 2021-02-22 07:15:14
Updated 2021-02-26 20:27:52
View at NVD,   CVE.org
Vulnerability category: Memory Corruption

Exploit prediction scoring system (EPSS) score for CVE-2020-11187

0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 10 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2020-11187

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.2
HIGH AV:L/AC:L/Au:N/C:C/I:C/A:C
3.9
10.0
NIST
7.8
HIGH CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
NIST

CWE ids for CVE-2020-11187

  • The product uses untrusted input when calculating or using an array index, but the product does not validate or incorrectly validates the index to ensure the index references a valid position within the array.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2020-11187

Products affected by CVE-2020-11187

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