Memory corruption while accessing the memory as payload size is not validated before access in Snapdragon Auto, Snapdragon Compute, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon IoT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables in MDM9150, MDM9206, MDM9607, MDM9615, MDM9640, MDM9650, MSM8909W, MSM8996AU, QCS405, QCS605, Qualcomm 215, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 600, SD 615/16/SD 415, SD 625, SD 632, SD 636, SD 665, SD 675, SD 712 / SD 710 / SD 670, SD 730, SD 820, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDA660, SDM439, SDM630, SDM660, SDX20, SDX24
Published 2019-11-06 17:15:14
Updated 2020-08-24 17:37:01
View at NVD,   CVE.org
Vulnerability category: Memory Corruption

Products affected by CVE-2019-2332

Exploit prediction scoring system (EPSS) score for CVE-2019-2332

0.25%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 64 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2019-2332

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
10.0
HIGH AV:N/AC:L/Au:N/C:C/I:C/A:C
10.0
10.0
NIST
9.8
CRITICAL CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
3.9
5.9
NIST

CWE ids for CVE-2019-2332

  • The product writes data past the end, or before the beginning, of the intended buffer.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2019-2332

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