An issue was discovered on Samsung mobile devices with N(7.1) and O(8.x) (Exynos chipsets) software. The ion debugfs driver allows information disclosure. The Samsung ID is SVE-2018-13427 (February 2019).
Published 2020-03-24 20:15:15
Updated 2021-07-21 11:39:24
Source MITRE
View at NVD,   CVE.org
Vulnerability category: Information leak

Products affected by CVE-2019-20625

Exploit prediction scoring system (EPSS) score for CVE-2019-20625

0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 10 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2019-20625

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
2.1
LOW AV:L/AC:L/Au:N/C:P/I:N/A:N
3.9
2.9
NIST
3.3
LOW CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:N/A:N
1.8
1.4
NIST

CWE ids for CVE-2019-20625

References for CVE-2019-20625

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