Vulnerability Details : CVE-2019-20607
An issue was discovered on Samsung mobile devices with N(7.x), O(8.x), and P(9.0) (MSM8996, MSM8998, Exynos7420, Exynos7870, Exynos8890, and Exynos8895 chipsets) software. A heap overflow in the keymaster Trustlet allows attackers to write to TEE memory, and achieve arbitrary code execution. The Samsung ID is SVE-2019-14126 (May 2019).
Vulnerability category: Memory Corruption
Products affected by CVE-2019-20607
- cpe:2.3:o:google:android:7.0:*:*:*:*:*:*:*
- cpe:2.3:o:google:android:7.1.2:*:*:*:*:*:*:*
- cpe:2.3:o:google:android:7.1.0:*:*:*:*:*:*:*
- cpe:2.3:o:google:android:7.1.1:*:*:*:*:*:*:*
- cpe:2.3:o:google:android:8.0:*:*:*:*:*:*:*
- cpe:2.3:o:google:android:8.1:*:*:*:*:*:*:*
- cpe:2.3:o:google:android:9.0:*:*:*:*:*:*:*
Exploit prediction scoring system (EPSS) score for CVE-2019-20607
0.14%
Probability of exploitation activity in the next 30 days
EPSS Score History
~ 50 %
Percentile, the proportion of vulnerabilities that are scored at or less
CVSS scores for CVE-2019-20607
| Base Score | Base Severity | CVSS Vector | Exploitability Score | Impact Score | Score Source | First Seen |
|---|---|---|---|---|---|---|
|
10.0
|
HIGH | AV:N/AC:L/Au:N/C:C/I:C/A:C |
10.0
|
10.0
|
NIST | |
|
9.8
|
CRITICAL | CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H |
3.9
|
5.9
|
NIST |
CWE ids for CVE-2019-20607
-
The product writes data past the end, or before the beginning, of the intended buffer.Assigned by: nvd@nist.gov (Primary)
References for CVE-2019-20607
-
https://security.samsungmobile.com/securityUpdate.smsb
Android Security Updates Details | Samsung Mobile SecurityVendor Advisory
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