An issue was discovered on Samsung mobile devices with O(8.1) and P(9.0) (Exynos chipsets) software. A heap overflow exists in the bootloader. The Samsung ID is SVE-2019-14371 (July 2019).
Published 2020-03-24 20:15:12
Updated 2020-03-26 17:32:01
Source MITRE
View at NVD,   CVE.org
Vulnerability category: Memory Corruption

Exploit prediction scoring system (EPSS) score for CVE-2019-20594

0.05%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 20 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2019-20594

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
4.6
MEDIUM AV:L/AC:L/Au:N/C:P/I:P/A:P
3.9
6.4
NIST
6.8
MEDIUM CVSS:3.1/AV:P/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
0.9
5.9
NIST

CWE ids for CVE-2019-20594

  • The product writes data past the end, or before the beginning, of the intended buffer.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2019-20594

Products affected by CVE-2019-20594

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