Vulnerability Details : CVE-2019-14000

Lack of check that the RX FIFO write index that is read from shared RAM is less than the FIFO size results into memory corruption and potential information leakage in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables, Snapdragon Wired Infrastructure and Networking in APQ8009, APQ8017, APQ8053, APQ8096, APQ8096AU, APQ8098, IPQ6018, IPQ8074, MDM9150, MDM9205, MDM9206, MDM9607, MDM9640, MDM9645, MDM9650, MDM9655, MSM8905, MSM8917, MSM8920, MSM8937, MSM8940, MSM8953, MSM8996, MSM8996AU, MSM8998, Nicobar, QCA8081, QCM2150, QCS404, QCS405, QCS605, QM215, Rennell, SA6155P, SC8180X, SDA660, SDA845, SDM429, SDM429W, SDM439, SDM450, SDM630, SDM632, SDM636, SDM660, SDM670, SDM710, SDM845, SDM850, SDX20, SDX24, SDX55, SM6150, SM7150, SM8150, SM8250, SXR1130, SXR2130
Published 2020-03-05 09:15:17
Updated 2020-08-24 17:37:01
Source Qualcomm, Inc.
View at NVD,   CVE.org
Vulnerability category: Memory Corruption

Products affected by CVE-2019-14000

Exploit prediction scoring system (EPSS) score for CVE-2019-14000

EPSS FAQ
0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 10 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2019-14000

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.2
 HIGH AV:L/AC:L/Au:N/C:C/I:C/A:C
3.9
10.0
 NIST
7.8
 HIGH CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
 NIST

CWE ids for CVE-2019-14000

  • The product writes data past the end, or before the beginning, of the intended buffer.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2019-14000

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