Double free issue can happen when sensor power settings is freed by some thread while another thread try to access. in Snapdragon Auto, Snapdragon Compute, Snapdragon Consumer Electronics Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables in APQ8053, MDM9206, MDM9207C, MDM9607, MSM8905, MSM8909, MSM8909W, QCN7605, QCS405, QCS605, SDM845, SDX24, SXR1130
Published 2019-11-06 17:15:13
Updated 2019-11-21 15:15:13
View at NVD,   CVE.org
Vulnerability category: Memory Corruption

Exploit prediction scoring system (EPSS) score for CVE-2019-10565

0.56%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 75 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2019-10565

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.5
HIGH AV:N/AC:L/Au:N/C:P/I:P/A:P
10.0
6.4
NIST
9.8
CRITICAL CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
3.9
5.9
NIST

CWE ids for CVE-2019-10565

  • The product calls free() twice on the same memory address, potentially leading to modification of unexpected memory locations.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2019-10565

Products affected by CVE-2019-10565

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