Improper input validation in TZ led to array out of bound in TZ function while accessing the peripheral details using the incoming data in Snapdragon Mobile, Snapdragon Wear version MDM9206, MDM9607, MDM9650, SD 210/SD 212/SD 205, SD 425, SD 430, SD 450, SD 625, SD 650/52, SD 835, SDA660.
Published 2018-10-26 13:29:02
Updated 2019-01-23 19:26:21
View at NVD,   CVE.org

Products affected by CVE-2018-5914

Exploit prediction scoring system (EPSS) score for CVE-2018-5914

0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 10 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2018-5914

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.2
HIGH AV:L/AC:L/Au:N/C:C/I:C/A:C
3.9
10.0
NIST
7.8
HIGH CVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
NIST

CWE ids for CVE-2018-5914

  • The product uses untrusted input when calculating or using an array index, but the product does not validate or incorrectly validates the index to ensure the index references a valid position within the array.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2018-5914

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