Improper length check while processing an MQTT message can lead to heap overflow in snapdragon mobile and snapdragon wear in versions MDM9206, MDM9607, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 450, SD 625, SD 636, SD 835, SDA660, SDM630, SDM660
Published 2019-01-18 22:29:01
Updated 2020-08-24 17:37:01
View at NVD,   CVE.org
Vulnerability category: Memory Corruption

Products affected by CVE-2018-5879

Exploit prediction scoring system (EPSS) score for CVE-2018-5879

0.08%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 33 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2018-5879

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
8.3
HIGH AV:A/AC:L/Au:N/C:C/I:C/A:C
6.5
10.0
NIST
8.8
HIGH CVSS:3.0/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
2.8
5.9
NIST

CWE ids for CVE-2018-5879

  • The product writes data past the end, or before the beginning, of the intended buffer.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2018-5879

Jump to
This web site uses cookies for managing your session, storing preferences, website analytics and additional purposes described in our privacy policy.
By using this web site you are agreeing to CVEdetails.com terms of use!