Lack of input validation for data received from user space can lead to an out of bound array issue in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables in version MDM9150, MDM9206, MDM9607, MDM9650, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 636, SD 820A, SD 835, SDM630, SDM660, SDX20.
Published 2019-02-25 22:29:03
Updated 2019-02-26 20:15:24
View at NVD,   CVE.org
Vulnerability category: Overflow

Products affected by CVE-2018-13914

Exploit prediction scoring system (EPSS) score for CVE-2018-13914

0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 10 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2018-13914

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
4.6
MEDIUM AV:L/AC:L/Au:N/C:P/I:P/A:P
3.9
6.4
NIST
7.8
HIGH CVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
NIST

CWE ids for CVE-2018-13914

  • The product performs operations on a memory buffer, but it reads from or writes to a memory location outside the buffer's intended boundary. This may result in read or write operations on unexpected memory locations that could be linked to other variables, data structures, or internal program data.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2018-13914

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