Out-of-Bounds access in TZ due to invalid index calculated to check against DDR in Snapdragon Auto, Snapdragon Connectivity, Snapdragon Consumer Electronics Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wired Infrastructure and Networking in IPQ8074, MDM9206, MDM9607, MDM9650, MDM9655, MSM8996AU, QCA8081, Qualcomm 215, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 632, SD 650/52, SD 820, SD 820A, SDM439, Snapdragon_High_Med_2016
Published 2019-06-14 17:29:01
Updated 2019-06-18 14:25:27
View at NVD,   CVE.org

Products affected by CVE-2018-13910

Exploit prediction scoring system (EPSS) score for CVE-2018-13910

0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 10 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2018-13910

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.2
HIGH AV:L/AC:L/Au:N/C:C/I:C/A:C
3.9
10.0
NIST
7.8
HIGH CVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
NIST

CWE ids for CVE-2018-13910

  • The product reads data past the end, or before the beginning, of the intended buffer.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2018-13910

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