Vulnerability Details : CVE-2018-11982
In Snapdragon (Mobile, Wear) in version MDM9206, MDM9607, MDM9635M, MDM9640, MDM9645, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 450, SD 615/16/SD 415, SD 617, SD 625, SD 650/52, SD 810, SD 820, SD 835, Snapdragon_High_Med_2016, a double free of ASN1 heap memory used for EUTRA CAP container occurs during UTRAN to LTE Capability inquiry procedure.
Vulnerability category: Memory Corruption
Products affected by CVE-2018-11982
- cpe:2.3:o:qualcomm:mdm9206_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:mdm9607_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:msm8909w_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:mdm9635m_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:mdm9640_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:mdm9645_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:mdm9655_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:msm8996au_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd210_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd212_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd205_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd425_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd427_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd430_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd435_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd450_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd617_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd625_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd650_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd652_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd820_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd835_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd410_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd412_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd615_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd616_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd415_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd810_firmware:-:*:*:*:*:*:*:*
Exploit prediction scoring system (EPSS) score for CVE-2018-11982
0.07%
Probability of exploitation activity in the next 30 days
EPSS Score History
~ 29 %
Percentile, the proportion of vulnerabilities that are scored at or less
CVSS scores for CVE-2018-11982
Base Score | Base Severity | CVSS Vector | Exploitability Score | Impact Score | Score Source | First Seen |
---|---|---|---|---|---|---|
8.3
|
HIGH | AV:A/AC:L/Au:N/C:C/I:C/A:C |
6.5
|
10.0
|
NIST | |
8.8
|
HIGH | CVSS:3.0/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H |
2.8
|
5.9
|
NIST |
CWE ids for CVE-2018-11982
-
The product calls free() twice on the same memory address, potentially leading to modification of unexpected memory locations.Assigned by: nvd@nist.gov (Primary)
References for CVE-2018-11982
-
https://www.qualcomm.com/company/product-security/bulletins
Security Advisories | Product Security | QualcommThird Party Advisory
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