Improper input validation on input which is used as an array index will lead to an out of bounds issue while processing AP find event from firmware in Snapdragon Auto, Snapdragon Consumer Electronics Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music in MDM9150, MDM9206, MDM9607, MDM9640, MDM9650, MSM8996AU, QCA6174A, QCA6574AU, QCA9377, QCA9379, SD 210/SD 212/SD 205, SD 625, SD 675, SD 712 / SD 710 / SD 670, SD 820, SD 820A, SD 845 / SD 850, SD 855, SDX20, SDX24, SM7150
Published 2019-05-24 17:29:01
Updated 2019-05-28 20:02:28
View at NVD,   CVE.org

Products affected by CVE-2018-11927

Exploit prediction scoring system (EPSS) score for CVE-2018-11927

0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 10 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2018-11927

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.2
HIGH AV:L/AC:L/Au:N/C:C/I:C/A:C
3.9
10.0
NIST
7.8
HIGH CVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
1.8
5.9
NIST

CWE ids for CVE-2018-11927

  • The product uses untrusted input when calculating or using an array index, but the product does not validate or incorrectly validates the index to ensure the index references a valid position within the array.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2018-11927

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