When FW tries to get random mac address generated from new SW RNG and ADC values read are constant then DUT get struck in loop while trying to get random ADC samples in Snapdragon Mobile in version SD 210/SD 212/SD 205, SD 425, SD 430, SD 450, SD 625, SD 650/52
Published 2018-10-26 13:29:01
Updated 2019-04-25 13:46:49
View at NVD,   CVE.org

Products affected by CVE-2018-11828

Exploit prediction scoring system (EPSS) score for CVE-2018-11828

0.09%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 38 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2018-11828

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.8
HIGH AV:N/AC:L/Au:N/C:N/I:N/A:C
10.0
6.9
NIST
7.5
HIGH CVSS:3.0/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H
3.9
3.6
NIST

CWE ids for CVE-2018-11828

  • The product does not properly control the allocation and maintenance of a limited resource, thereby enabling an actor to influence the amount of resources consumed, eventually leading to the exhaustion of available resources.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2018-11828

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