Vulnerability Details : CVE-2018-11279

Lack of check of input size can make device memory get corrupted because of buffer overflow in snapdragon automobile, snapdragon mobile and snapdragon wear in versions MDM9206, MDM9607, MDM9615, MDM9625, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 615/16/SD 415, SD 625, SD 636, SD 650/52, SD 712 / SD 710 / SD 670, SD 810, SD 820, SD 820A, SD 835, SD 845 / SD 850, SDA660, SDM439, SDM630, SDM660, SDX20, Snapdragon_High_Med_2016, SXR1130
Published 2019-01-18 22:29:00
Updated 2019-01-25 14:24:49
Source Qualcomm, Inc.
View at NVD,   CVE.org
Vulnerability category: Overflow

Exploit prediction scoring system (EPSS) score for CVE-2018-11279

EPSS FAQ
0.07%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 31 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2018-11279

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
8.3
 HIGH AV:A/AC:L/Au:N/C:C/I:C/A:C
6.5
10.0
 NIST
8.8
 HIGH CVSS:3.0/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
2.8
5.9
 NIST

CWE ids for CVE-2018-11279

  • The product performs operations on a memory buffer, but it reads from or writes to a memory location outside the buffer's intended boundary. This may result in read or write operations on unexpected memory locations that could be linked to other variables, data structures, or internal program data.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2018-11279

Products affected by CVE-2018-11279

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