An issue was discovered on Samsung mobile devices with M(6.0) and N(7.x) software. There is a stack-based buffer overflow with resultant memory corruption in a trustlet. The Samsung IDs are SVE-2017-8889, SVE-2017-8891, and SVE-2017-8892 (August 2017).
Published 2020-04-07 16:15:16
Updated 2020-04-08 13:45:54
Source MITRE
View at NVD,   CVE.org
Vulnerability category: OverflowMemory Corruption

Products affected by CVE-2017-18655

Exploit prediction scoring system (EPSS) score for CVE-2017-18655

0.16%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 33 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2017-18655

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.5
HIGH AV:N/AC:L/Au:N/C:P/I:P/A:P
10.0
6.4
NIST
9.8
CRITICAL CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
3.9
5.9
NIST

CWE ids for CVE-2017-18655

  • The product writes data past the end, or before the beginning, of the intended buffer.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2017-18655

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