An issue was discovered on Samsung mobile devices with M(6.x) and N(7.x) software. There is an Integer Overflow in process_M_SetTokenTUIPasswd during handling of a trusted application, leading to memory corruption. The Samsung IDs are SVE-2017-9008 and SVE-2017-9009 (October 2017).
Published 2020-04-07 16:15:15
Updated 2020-04-08 16:44:39
Source MITRE
View at NVD,   CVE.org
Vulnerability category: OverflowMemory Corruption

Products affected by CVE-2017-18651

Exploit prediction scoring system (EPSS) score for CVE-2017-18651

0.08%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 34 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2017-18651

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
5.0
MEDIUM AV:N/AC:L/Au:N/C:N/I:N/A:P
10.0
2.9
NIST
7.5
HIGH CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H
3.9
3.6
NIST

CWE ids for CVE-2017-18651

  • The product performs a calculation that can produce an integer overflow or wraparound when the logic assumes that the resulting value will always be larger than the original value. This occurs when an integer value is incremented to a value that is too large to store in the associated representation. When this occurs, the value may become a very small or negative number.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2017-18651

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