Vulnerability Details : CVE-2017-18320
QSEE unload attempt on a 3rd party TEE without previously loading results in a data abort in snapdragon automobile and snapdragon mobile in versions MSM8996AU, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 615/16/SD 415, SD 625, SD 632, SD 636, SD 650/52, SD 712 / SD 710 / SD 670, SD 810, SD 820, SD 820A, SD 835, SDA660, SDM439, SDM630, SDM660, SDX24, Snapdragon_High_Med_2016, SXR1130.
Vulnerability category: Input validation
Products affected by CVE-2017-18320
- cpe:2.3:o:qualcomm:sd_410_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_425_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_430_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_615_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_415_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_625_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_650_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_820_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_835_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_412_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_616_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_652_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_450_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_810_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_820a_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_427_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_435_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sdm630_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sdm660_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:msm8996au_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:snapdragon_high_med_2016_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sdm439_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sda660_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sdx24_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sxr1130_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_439_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_429_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_632_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_636_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_712_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_710_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_670_firmware:-:*:*:*:*:*:*:*
Exploit prediction scoring system (EPSS) score for CVE-2017-18320
0.04%
Probability of exploitation activity in the next 30 days
EPSS Score History
~ 8 %
Percentile, the proportion of vulnerabilities that are scored at or less
CVSS scores for CVE-2017-18320
Base Score | Base Severity | CVSS Vector | Exploitability Score | Impact Score | Score Source | First Seen |
---|---|---|---|---|---|---|
7.2
|
HIGH | AV:L/AC:L/Au:N/C:C/I:C/A:C |
3.9
|
10.0
|
NIST | |
7.8
|
HIGH | CVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H |
1.8
|
5.9
|
NIST |
CWE ids for CVE-2017-18320
-
The product receives input or data, but it does not validate or incorrectly validates that the input has the properties that are required to process the data safely and correctly.Assigned by: nvd@nist.gov (Primary)
References for CVE-2017-18320
-
http://www.securityfocus.com/bid/106128
Qualcomm Closed-Source Components Multiple Unspecified VulnerabilitiesThird Party Advisory;VDB Entry
-
https://www.qualcomm.com/company/product-security/bulletins
Security Advisories | Product Security | QualcommVendor Advisory
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