Under certain mode of operations, HLOS may be able get direct or indirect access through DXE channels to tamper with the authenticated WCNSS firmware stored in DDR because DXE-accessible memory is located within the authenticated image in Snapdragon Mobile and Snapdragon Wear in version MSM8909W, SD 210/SD 212/SD 205, SD 410/12, SD 615/16/SD 415, SD 617.
Published 2018-10-23 13:29:03
Updated 2019-10-03 00:03:26
View at NVD,   CVE.org

Exploit prediction scoring system (EPSS) score for CVE-2017-18313

0.07%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 29 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2017-18313

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
5.7
MEDIUM AV:A/AC:M/Au:N/C:N/I:C/A:N
5.5
6.9
NIST
5.3
MEDIUM CVSS:3.0/AV:A/AC:H/PR:N/UI:N/S:U/C:N/I:H/A:N
1.6
3.6
NIST

References for CVE-2017-18313

Products affected by CVE-2017-18313

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