Vulnerability Details : CVE-2017-18313
Under certain mode of operations, HLOS may be able get direct or indirect access through DXE channels to tamper with the authenticated WCNSS firmware stored in DDR because DXE-accessible memory is located within the authenticated image in Snapdragon Mobile and Snapdragon Wear in version MSM8909W, SD 210/SD 212/SD 205, SD 410/12, SD 615/16/SD 415, SD 617.
Exploit prediction scoring system (EPSS) score for CVE-2017-18313
0.07%
Probability of exploitation activity in the next 30 days
EPSS Score History
~ 29 %
Percentile, the proportion of vulnerabilities that are scored at or less