Vulnerability Details : CVE-2017-18297
Double memory free while closing TEE SE API Session management in Snapdragon Mobile in version SD 425, SD 430, SD 450, SD 625, SD 650/52, SD 820.
Products affected by CVE-2017-18297
- cpe:2.3:o:qualcomm:sd_425_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_430_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_625_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_650_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_820_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_652_firmware:-:*:*:*:*:*:*:*
- cpe:2.3:o:qualcomm:sd_450_firmware:-:*:*:*:*:*:*:*
Exploit prediction scoring system (EPSS) score for CVE-2017-18297
0.05%
Probability of exploitation activity in the next 30 days
EPSS Score History
~ 19 %
Percentile, the proportion of vulnerabilities that are scored at or less
CVSS scores for CVE-2017-18297
Base Score | Base Severity | CVSS Vector | Exploitability Score | Impact Score | Score Source | First Seen |
---|---|---|---|---|---|---|
7.2
|
HIGH | AV:L/AC:L/Au:N/C:C/I:C/A:C |
3.9
|
10.0
|
NIST | |
7.8
|
HIGH | CVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H |
1.8
|
5.9
|
NIST |
CWE ids for CVE-2017-18297
-
The product calls free() twice on the same memory address, potentially leading to modification of unexpected memory locations.Assigned by: nvd@nist.gov (Primary)
References for CVE-2017-18297
-
http://www.securitytracker.com/id/1041432
Google Android Multiple Flaws Let Remote Users Execute Arbitrary Code and Let Applications Gain Elevated Privileges and Obtain Potentially Sensitive Information - SecurityTrackerThird Party Advisory;VDB Entry
-
https://www.qualcomm.com/company/product-security/bulletins
Security Advisories | Product Security | QualcommVendor Advisory
-
https://source.android.com/security/bulletin/2018-08-01#qualcomm-closed-source-components
Android Security Bulletin—August 2018 | Android Open Source ProjectThird Party Advisory
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