Improper input validation in Bluetooth Controller function can lead to possible memory corruption in Snapdragon Mobile in version QCA9379, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 450, SD 615/16/SD 415, SD 625, SD 650/52, SD 820, SD 835, SD 845, SD 850, SDM630, SDM636, SDM660, SDM710, Snapdragon_High_Med_2016.
Published 2018-10-23 13:29:00
Updated 2018-12-11 21:03:50
View at NVD,   CVE.org
Vulnerability category: Memory Corruption

Products affected by CVE-2017-18170

Exploit prediction scoring system (EPSS) score for CVE-2017-18170

0.08%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 32 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2017-18170

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
8.3
HIGH AV:A/AC:L/Au:N/C:C/I:C/A:C
6.5
10.0
NIST
8.8
HIGH CVSS:3.0/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
2.8
5.9
NIST

CWE ids for CVE-2017-18170

  • The product subtracts one value from another, such that the result is less than the minimum allowable integer value, which produces a value that is not equal to the correct result.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2017-18170

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