Huawei DP300 V500R002C00, NIP6600 V500R001C00, V500R001C20, V500R001C30, Secospace USG6500 V500R001C00, V500R001C20, V500R001C30, TE60 V100R001C01, V100R001C10, V100R003C00, V500R002C00, V600R006C00, TP3106 V100R001C06, V100R002C00, VP9660 V200R001C02, V200R001C30, V500R002C00, V500R002C10, ViewPoint 8660 V100R008C03, ViewPoint 9030 V100R011C02, V100R011C03, eCNS210_TD V100R004C10, eSpace U1981 V200R003C30 have a DoS vulnerability caused by memory exhaustion in some Huawei products. For lacking of adequate input validation, attackers can craft and send some malformed messages to the target device to exhaust the memory of the device and cause a Denial of Service (DoS).
Published 2018-03-09 21:29:01
Updated 2018-03-27 20:28:36
View at NVD,   CVE.org
Vulnerability category: Denial of service

Exploit prediction scoring system (EPSS) score for CVE-2017-15323

0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 10 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2017-15323

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
4.9
MEDIUM AV:L/AC:L/Au:N/C:N/I:N/A:C
3.9
6.9
NIST
5.5
MEDIUM CVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:N/I:N/A:H
1.8
3.6
NIST

CWE ids for CVE-2017-15323

  • The product does not properly control the allocation and maintenance of a limited resource, thereby enabling an actor to influence the amount of resources consumed, eventually leading to the exhaustion of available resources.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2017-15323

Products affected by CVE-2017-15323

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