Huawei DP300 V500R002C00, RP200 V500R002C00SPC200, V600R006C00, TE30 V100R001C10SPC300, V100R001C10SPC500, V100R001C10SPC600, V100R001C10SPC700, V500R002C00SPC200, V500R002C00SPC500, V500R002C00SPC600, V500R002C00SPC700, V500R002C00SPC900, V500R002C00SPCb00, V600R006C00, TE40 V500R002C00SPC600, V500R002C00SPC700, V500R002C00SPC900, V500R002C00SPCb00, V600R006C00, TE50 V500R002C00SPC600, V500R002C00SPC700, V500R002C00SPCb00, V600R006C00, TE60 V100R001C10, V500R002C00, V600R006C00 have a memory leak vulnerability due to memory don't be released when the XML parser process some node fail. An attacker could exploit it to cause memory leak, which may further lead to system exceptions.
Published 2018-03-09 21:29:00
Updated 2019-10-03 00:03:26
View at NVD,   CVE.org

Exploit prediction scoring system (EPSS) score for CVE-2017-15314

0.04%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 10 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2017-15314

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
2.1
LOW AV:L/AC:L/Au:N/C:N/I:N/A:P
3.9
2.9
NIST
5.5
MEDIUM CVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:N/I:N/A:H
1.8
3.6
NIST

CWE ids for CVE-2017-15314

References for CVE-2017-15314

Products affected by CVE-2017-15314

This web site uses cookies for managing your session, storing preferences, website analytics and additional purposes described in our privacy policy.
By using this web site you are agreeing to CVEdetails.com terms of use!