In Android before 2018-01-05 on Qualcomm Snapdragon IoT, Snapdragon Mobile MDM9206, SD 625, SD 650/52, SD 835, SD 845, DDR address input validation is being improperly truncated.
Published 2018-03-30 15:29:01
Updated 2018-04-27 15:23:17
View at NVD,   CVE.org
Vulnerability category: Input validation

Exploit prediction scoring system (EPSS) score for CVE-2017-14913

0.53%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 75 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2017-14913

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
10.0
HIGH AV:N/AC:L/Au:N/C:C/I:C/A:C
10.0
10.0
NIST
9.8
CRITICAL CVSS:3.0/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
3.9
5.9
NIST

CWE ids for CVE-2017-14913

  • The product receives input or data, but it does not validate or incorrectly validates that the input has the properties that are required to process the data safely and correctly.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2017-14913

Products affected by CVE-2017-14913

This web site uses cookies for managing your session, storing preferences, website analytics and additional purposes described in our privacy policy.
By using this web site you are agreeing to CVEdetails.com terms of use!