Vulnerability Details : CVE-2017-11011

In Android before security patch level 2018-04-05 on Qualcomm Snapdragon Mobile and Snapdragon Wear MDM9206, MDM9607, SD 210/SD 212/SD 205, SD 425, SD 430, SD 450, SD 625, SD 820, SD 835, a Use After Free condition can occur in a communication API.
Published 2018-04-11 15:29:00
Updated 2018-05-16 18:04:08
Source Qualcomm, Inc.
View at NVD,   CVE.org
Vulnerability category: Memory Corruption

Exploit prediction scoring system (EPSS) score for CVE-2017-11011

EPSS FAQ
0.19%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 55 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2017-11011

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
10.0
 HIGH AV:N/AC:L/Au:N/C:C/I:C/A:C
10.0
10.0
 NIST
9.8
 CRITICAL CVSS:3.0/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
3.9
5.9
 NIST

CWE ids for CVE-2017-11011

  • The product reuses or references memory after it has been freed. At some point afterward, the memory may be allocated again and saved in another pointer, while the original pointer references a location somewhere within the new allocation. Any operations using the original pointer are no longer valid because the memory "belongs" to the code that operates on the new pointer.
    Assigned by: nvd@nist.gov (Primary)

References for CVE-2017-11011

Products affected by CVE-2017-11011

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