In Android before 2018-04-05 or earlier security patch level on Qualcomm Snapdragon Mobile and Snapdragon Wear MDM9206, MDM9607, MDM9615, MDM9625, MDM9635M, MDM9640, MDM9645, MSM8909W, SD 210/SD 212/SD 205, SD 400, SD 410/12, SD 425, SD 430, SD 450, SD 600, SD 615/16/SD 415, SD 617, SD 625, SD 650/52, SD 800, SD 808, SD 810, and SD 820, UE crash is seen due to IPCMem exhaustion, when UDP data is pumped to UE's ULP (UserPlane Location protocol) UDP port 7275.
Published 2018-04-18 14:29:10
Updated 2018-05-02 12:57:04
View at NVD,   CVE.org

Products affected by CVE-2016-10416

Exploit prediction scoring system (EPSS) score for CVE-2016-10416

0.08%
Probability of exploitation activity in the next 30 days EPSS Score History
~ 37 %
Percentile, the proportion of vulnerabilities that are scored at or less

CVSS scores for CVE-2016-10416

Base Score Base Severity CVSS Vector Exploitability Score Impact Score Score Source First Seen
7.8
HIGH AV:N/AC:L/Au:N/C:N/I:N/A:C
10.0
6.9
NIST
7.5
HIGH CVSS:3.0/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H
3.9
3.6
NIST

CWE ids for CVE-2016-10416

  • Assigned by: nvd@nist.gov (Primary)

References for CVE-2016-10416

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